Shot-Noise-Limited Nanomechanical Detection and Radiation Pressure Backaction from an Electron Beam

S. Pairis, F. Donatini, M. Hocevar, D. Tumanov, N. Vaish, J. Claudon, J.-P. Poizat, and P. Verlot

Phys. Rev. Lett. 122, 083603 – Published 1 March 2019

In this work, the authors investigate the fundamental processes in the electromechanical measurement of the vibrational fluctuations of nanowires using an electron beam. They demonstrate that the noise of the measurement corresponds to the partition noise of secondary electrons, and they evidence a radial backaction process that they identify as the exchange of momentum between the nanowires and the electrons.